SAE ARD50011 Modular Avionics Backplane Functional Requirements and Consensus Items (MABFFACI) (Cancelled Sep 1992)
时间:2024-05-17 22:37:02 来源: 标准资料网 作者：标准资料网 阅读：9118
Product Code:SAE ARD50011
Title:Modular Avionics Backplane Functional Requirements and Consensus Items (MABFFACI) (Cancelled Sep 1992)
Issuing Committee:As-1 Aircraft Systems And Systems Integration
Scope: This document contains functional requirements for modular avionics backplanes as developed by the Backplane Interconnect Requirements Task (BIRST) group of the SAE AS-2 Interconnect Networks Committee. In addition to defining the requirements for modular avionic backplane interfaces, a suggested list of associated documents is included. Consensus items and rationale on all the above areas are also presented. These requirements are an edited compilation of those voiced by numerous military and commercial organizations primarily concerning aircraft applications.
【英文标准名称】:Bias-temperaturestabilitytestformetal-oxide,semiconductor,field-effecttransistors(MOSFET).
【原文标准名称】:金属氧化半导体场效应晶体管(MOSFET)的基本温度稳定性试验
【标准号】:NFC96-051-2006
【标准状态】:现行
【国别】:法国
【发布日期】:2006-10-01
【实施或试行日期】:2006-10-20
【发布单位】:法国标准化协会(FR-AFNOR)
【起草单位】:
【标准类型】:()
【标准水平】:()
【中文主题词】:检验设备;组件;定义;电气工程;电子工程;电子设备及元件;场效应晶体管;极限(数学);测量设备;额定值;半导体器件;稳定性;温度应力;试验;试验装置;热应力;晶体管
【英文主题词】:Checkingequipment;Components;Definition;Definitions;Electricalengineering;Electronicengineering;Electronicequipmentandcomponents;Field-effecttransistors;Limits(mathematics);Measuringequipment;Ratings;Semiconductordevices;Stability;Temperaturestress;Testing;Testingdevices;Thermalstress;Transistors
【摘要】:
【中国标准分类号】:L42
【国际标准分类号】:31_080_30
【页数】:15P.;A4
【正文语种】:其他
Product Code:SAE ARP5107
Title:Guidelines for Time-Limited-Dispatch (Tld) Analysis for Electronic Engine Control Systems
Issuing Committee:E-36 Electronic Engine Controls Committee
Scope:This SAE Aerospace Recommended Practice (ARP) provides methodologies and approaches which have been used for conducting and documenting the analyses associated with the application of Time Limited Dispatch (TLD) to the thrust control reliability of Full Authority Digital Electronic Control (FADEC) systems. The TLD concept is one wherein a redundant system is allowed to operate for a predetermined length of time with faults present in the redundant elements of the system, before repairs are required. This document includes the background of the development of TLD, the structure of TLD that was developed and implemented on present generation commercial transports, and the analysis methods used to validate the application of TLD on present day FADEC equipped aircraft. Although this document is specific to TLD analyses (for FADEC systems) of the loss of thrust control, the techniques and processes discussed in this document are considered applicable to other FADEC system failure effects or other systems, such as, thrust reverser, and propeller control systems, and overspeed protection systems.